Rajeev Ahuja, Uppsala University, Sweden

Martin Dornheim, Helmholtz Association, Germany

Etsuo Akiba, Kyushu University, Japan

Haiwen Li, Kyushu University, Japan

Zhenguo Huang, University of Wollongong, Australia

IEA-HIA Task 32

Hui Wu , 美国国家标准与技术研究院(National Institute of Standardsand Technology, NIST, USA)

吴安安, 厦门大学

Yuanping Feng, National University of Singapore

Tejs Vegge, Technical University of Denmark

S Thomas Autrey, Pacific Northwest National Laboratory, USA